Kyocera and Rohde & Schwarz to Demonstrate OTA Characterization of mmWave PAAM at IMS

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Kyocera and Rohde & Schwarz to Demonstrate OTA Characterization of mmWave PAAM at IMS

Kyocera and Rohde & Schwarz announced that they will showcase the characterization of a novel mmWave, phased array antenna for a variety of sensing and communication applications, June 17-19, at IMS San Francisco 2025.

Kyocera and Rohde & Schwarz announced that they will showcase the characterization of a novel mmWave, phased array antenna for a variety of sensing and communication applications, June 17-19, at IMS San Francisco 2025.

http://www.microwavejournal.com/rss/topic/3369-industry-news

RF & Microwave Industry News

https://www.microwavejournal.com/articles/44158-kyocera-and-rohde-and-schwarz-to-demonstrate-ota-characterization-of-mmwave-paam-at-ims

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